MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 6061A Sub4 DATE: 28-Jun-96 AUTHOR: REVISION: ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 44 NUMBER OF LINES: 251 CONFIGURATION: HP 8566B ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R N P F W 1.002 ASK+ X 1.003 HEAD 1.004 HEAD {* HARMONIC AND SPURIOUS TEST *} 1.005 HEAD {} 1.006 HEAD {Center Frequency @ 0.4MHz} 1.007 JMP 2.001 1.008 EVAL Dummy 2.001 HEAD HARMONIC AND SPURIOUS TEST 2.002 DISP Connect the UUT OUTPUT to the Hewlett-Packard 8566B 2.002 DISP Spectrum Analyzer RF INPUT connector. 2.003 IEEE RC98 2.003 IEEE FR0.4MZ 2.003 IEEE AP13DB 2.004 IEEE [@8566] [TERM LF] 2.005 IEEE [@8566] IP, RL30DB, CF.4MZ, SP.1MZ 2.006 IEEE [@8566] [D1000] MKPK 2.006 IEEE [@8566] [D1000] MT1 2.006 IEEE [@8566] [D1000] MKRL, MKSS, MKD, CF UP 2.007 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 2.008 MEMC -30.00D +120U -0U 0.8MH 3.001 IEEE [@8566] CF UP 3.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 3.002 MEMC -30.00D +120U -0U 1.2MH 4.001 IEEE [@8566] CF UP 4.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 4.002 MEMC -30.00D +120U -0U 1.6MH 5.001 HEAD {} 5.002 HEAD {Center Frequency @ 50MHz} 5.003 JMP 6.001 5.004 EVAL Dummy 6.001 HEAD HARMONIC AND SPURIOUS TEST 6.002 IEEE FR50MZ 6.002 IEEE AP13DB 6.003 IEEE [@8566] IP, RL30DB, CF50MZ, SP1MZ 6.004 IEEE [@8566] [D1000] MKPK 6.004 IEEE [@8566] [D1000] MT1 6.004 IEEE [@8566] [D1000] MKRL, MKSS, MKD, CF UP 6.005 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 6.006 MEMC -30.00D +120U -0U 100MH 7.001 IEEE [@8566] CF UP 7.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 7.002 MEMC -30.00D +120U -0U 150MH 8.001 IEEE [@8566] VB1KZ, CF UP 8.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 8.002 MEMC -30.00D +120U -0U 200MH 9.001 HEAD {} 9.002 HEAD {Center Frequency @ 240MHz} 9.003 JMP 10.001 9.004 EVAL Dummy 10.001 HEAD HARMONIC AND SPURIOUS TEST 10.002 IEEE FR240MZ 10.002 IEEE AP13DB 10.003 IEEE [@8566] IP, RL30DB, CF240MZ, SP1MZ 10.004 IEEE [@8566] [D1000] MKPK 10.004 IEEE [@8566] [D1000] MT1 10.004 IEEE [@8566] [D1000] MKRL, MKSS, MKD, CF UP 10.005 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 10.006 MEMC -30.00D +120U -0U 480MH 11.001 IEEE [@8566] CF UP 11.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 11.002 MEMC -30.00D +120U -0U 720MH 12.001 IEEE [@8566] CF UP 12.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 12.002 MEMC -30.00D +120U -0U 960MH 13.001 HEAD {} 13.002 HEAD {Center Frequency @ 300MHz} 13.003 JMP 14.001 13.004 EVAL Dummy 14.001 HEAD HARMONIC AND SPURIOUS TEST 14.002 IEEE FR300MZ 14.002 IEEE AP13DB 14.003 IEEE [@8566] IP, RL30DB, CF300MZ, SP1MZ 14.004 IEEE [@8566] [D1000] MKPK 14.004 IEEE [@8566] [D1000] MT1 14.004 IEEE [@8566] [D1000] MKRL, MKSS, MKD, CF UP 14.005 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 14.006 MEMC -30.00D +120U -0U 600MH 15.001 IEEE [@8566] CF UP 15.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 15.002 MEMC -30.00D +120U -0U 900MH 16.001 IEEE [@8566] CF UP 16.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 16.002 MEMC -30.00D +120U -0U 1200MH 17.001 HEAD {} 17.002 HEAD {Center Frequency @ 500MHz} 17.003 JMP 18.001 17.004 EVAL Dummy 18.001 HEAD HARMONIC AND SPURIOUS TEST 18.002 IEEE FR500MZ 18.002 IEEE AP13DB 18.003 IEEE [@8566] IP, RL30DB, CF500MZ, SP1MZ 18.004 IEEE [@8566] [D1000] MKPK 18.004 IEEE [@8566] [D1000] MT1 18.004 IEEE [@8566] [D1000] MKRL, MKSS, MKD, CF UP 18.005 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 18.006 MEMC -30.00D +120U -0U 1000MH 19.001 IEEE [@8566] CF UP 19.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 19.002 MEMC -30.00D +120U -0U 1500MH 20.001 IEEE [@8566] CF UP 20.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 20.002 MEMC -30.00D +120U -0U 2000MH 21.001 HEAD {} 21.002 HEAD {Center Frequency @ 750MHz} 21.003 JMP 22.001 21.004 EVAL Dummy 22.001 HEAD HARMONIC AND SPURIOUS TEST 22.002 IEEE FR750MZ 22.002 IEEE AP13DB 22.003 IEEE [@8566] IP, RL30DB, CF750MZ, SP1MZ 22.004 IEEE [@8566] [D1000] MKPK 22.004 IEEE [@8566] [D1000] MT1 22.004 IEEE [@8566] [D1000] MKRL, MKSS, MKD, CF UP 22.005 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 22.006 MEMC -30.00D +120U -0U 1500MH 23.001 IEEE [@8566] CF UP 23.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 23.002 MEMC -30.00D +120U -0U 2250MH 24.001 IEEE [@8566] CF UP 24.001 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 24.002 MEMC -30.00D +120U -0U 3000MH 25.001 HEAD {} 25.002 HEAD {Center Frequency @ 185MHz} 25.003 JMP 26.001 25.004 EVAL Dummy 26.001 HEAD HARMONIC AND SPURIOUS TEST 26.002 IEEE FR185MZ 26.002 IEEE AP13DB 26.003 IEEE [@8566] IP, RL30DB, CF185MZ, SP1MZ 26.004 IEEE [@8566] [D1000] MKPK 26.004 IEEE [@8566] [D1000] MT1 26.004 IEEE [@8566] [D1000] MKRL, SS60MZ, MKD, CF UP 26.005 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 26.006 MEMC -60.00D +120U -0U 245MH 27.001 HEAD {} 27.002 HEAD {Center Frequency @ 244MHz} 27.003 JMP 28.001 27.004 EVAL Dummy 28.001 HEAD HARMONIC AND SPURIOUS TEST 28.002 IEEE FR244MZ 28.002 IEEE AP13DB 28.003 IEEE [@8566] IP, RL30DB, CF244MZ, SP1MZ 28.004 IEEE [@8566] [D1000] MKPK 28.004 IEEE [@8566] [D1000] MT1 28.004 IEEE [@8566] [D1000] MKRL, SS68MZ, MKD, CF UP 28.005 IEEE [@8566] [D1000] MT1 [D1000] MA?[I] 28.006 MEMC -60.00D +120U -0U 312MH 29.001 HEAD {} 29.002 HEAD {Center Frequency @ 244.99MHz} 29.003 JMP 30.001 29.004 EVAL Dummy 30.001 HEAD HARMONIC AND SPURIOUS TEST 30.002 IEEE FR244.99MZ 30.002 IEEE AP0DB 30.003 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP5KZ 30.004 IEEE [@8566] TS, DONE, MKPK 30.004 IEEE [@8566] [D1000] MT1 30.004 IEEE [@8566] [D1000] MKRL, SS20KZ, MKD, CF UP 30.005 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 30.006 MEMC -60.00D +120U -0U 20kH_offset 31.001 IEEE [@8566] [D1000] SS10KZ, CF UP 31.002 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 31.003 MEMC -60.00D +120U -0U 30kH_offset 32.001 IEEE [@8566] [D1000] SS5KZ, CF UP 32.002 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 32.003 MEMC -60.00D +120U -0U 35kH_offset 33.001 IEEE [@8566] [D1000] CF UP 33.002 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 33.003 MEMC -60.00D +120U -0U 40kH_11fset 34.001 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP500KZ 34.002 IEEE [@8566] TS, DONE, MKPK 34.002 IEEE [@8566] [D1000] MT1 34.002 IEEE [@8566] [D1000] MKRL, SS1MZ, MKD, CF UP 34.003 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 34.004 MEMC -60.00D +120U -0U 1MH_offset 35.001 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP500KZ 35.002 IEEE [@8566] TS, DONE, MKPK 35.002 IEEE [@8566] [D1000] MT1 35.002 IEEE [@8566] [D1000] MKRL, SS10MZ, MKD, CF UP 35.003 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 35.004 MEMC -60.00D +120U -0U 10MH_offset 36.001 HEAD {} 36.002 HEAD {External AM on} 36.003 JMP 37.001 36.004 EVAL Dummy 37.001 HEAD HARMONIC AND SPURIOUS TEST 37.002 IEEE FR244.99MZ 37.002 IEEE AP1DB 37.002 IEEE AE1 37.002 IEEE AM30PC 37.003 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP1MZ 37.004 IEEE [@8566] TS, DONE, MKPK 37.004 IEEE [@8566] [D1000] MT1 37.004 IEEE [@8566] [D1000] MKRL, SS10MZ, MKD, CF UP 37.005 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 37.006 MEMC -60.00D +120U -0U 10MH_offset 38.001 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP1MZ 38.002 IEEE [@8566] TS, DONE, MKPK 38.002 IEEE [@8566] [D1000] MT1 38.002 IEEE [@8566] [D1000] MKRL, SS20MZ, MKD, CF UP 38.003 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 38.004 MEMC -60.00D +120U -0U 20MH_offset 39.001 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP1MZ 39.002 IEEE [@8566] TS, DONE, MKPK 39.002 IEEE [@8566] [D1000] MT1 39.002 IEEE [@8566] [D1000] MKRL, SS30MZ, MKD, CF UP 39.003 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 39.004 MEMC -60.00D +120U -0U 30MH_offset 40.001 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP1MZ 40.002 IEEE [@8566] TS, DONE, MKPK 40.002 IEEE [@8566] [D1000] MT1 40.002 IEEE [@8566] [D1000] MKRL, SS800MZ, MKD, CF UP 40.003 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 40.004 MEMC -60.00D +120U -0U 800MH_offset 41.001 IEEE [@8566] IP, RL30DB, CF244.99MZ, SP1MZ 41.002 IEEE [@8566] TS, DONE, MKPK 41.002 IEEE [@8566] [D1000] MT1 41.002 IEEE [@8566] [D1000] MKRL, SS1044.99MZ, MKD, CF UP 41.003 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 41.004 MEMC -60.00D +120U -0U 1044.99MH 42.001 HEAD {} 42.002 HEAD {External AM off} 42.003 JMP 43.001 42.004 EVAL Dummy 43.001 HEAD HARMONIC AND SPURIOUS TEST 43.002 IEEE RC98 43.003 IEEE FR600MZ 43.003 IEEE AP0DB 43.004 IEEE [@8566] IP, RL30DB, CF600MZ, SP10MZ 43.005 IEEE [@8566] TS, DONE, MKPK 43.005 IEEE [@8566] [D1000] MT1 43.005 IEEE [@8566] [D1000] MKRL, SS300MZ, MKD, CF UP 43.006 IEEE [@8566] TS, DONE, MT1 [D1000] MA?[I] 43.007 MEMC -60.00D +120U -0U 300MH_offset 44.001 HEAD 44.002 DISP [27][91]1mDisconnect the test set-up. 44.003 IEEE [@8566] IP, KSg 44.004 END